Micromanipulator 450PM-B

Probe Station and SMU
Bank holiday 25 Dec Bay 14A Translational Research Hub
Internal name
PROBE01
Process types
Metrology Packaging and Back End Processing
Description
Micromanipulator 450PM-B manual analytical probe station for on-wafer electrical characterisation, handling substrates up to 200mm on a vacuum chuck with full-wafer stage travel. Configurable for DC, RF and high-power measurements with a stable-boom microscope for precise probe positioning, paired with a source measure unit (SMU) for I-V and device testing.
PROBE01 image