Unavailable until 26 Oct, 12:30
Bay 11B Translational Research Hub
Internal name
AFM
Process types
Metrology
Description
The Bruker Dimension Icon is a large-sample atomic force microscope for high-resolution nanoscale imaging and characterisation. It accepts samples up to 200mm diameter and 15mm thick with a 90 x 90um XY scan range and 10um Z range, and features ScanAsyst self-optimising imaging with PeakForce Tapping for easy, high-quality results.